New short and efficient algorithm for testing random-access memories

Proceedings:

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

ISBN: 0780350081

Year of publication: 1998

Volume: 1

Pages: 541-544

Type: Conference paper

DOI: 10.1109/ICECS.1998.813380 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus