Merit function segmentation dependence on the isoplanatic patch criterion

  1. Pizarro, C.
  2. Diaz, J.A.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819464279

Year of publication: 2006

Volume: 6342 II

Type: Conference paper

DOI: 10.1117/12.692227 GOOGLE SCHOLAR