Merit function segmentation dependence on the isoplanatic patch criterion

  1. Pizarro, C.
  2. Diaz, J.A.
Actes de conférence:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819464279

Année de publication: 2006

Volumen: 6342 II

Type: Communication dans un congrès

DOI: 10.1117/12.692227 GOOGLE SCHOLAR