Experimental characterization of peripheral photocurrent in CMOS photodiodes down to 65 nm technology

  1. Blanco-Filgueira, B.
  2. López, P.
  3. Roldán, J.B.
Aldizkaria:
Semiconductor Science and Technology

ISSN: 0268-1242,  1361-6641

Argitalpen urtea: 2013

Alea: 28

Zenbakia: 4

Mota: Artikulua

DOI: 10.1088/0268-1242/28/4/045011 GOOGLE SCHOLAR
Datuen iturria: Scopus