Simulation of transmission electron microscopy images using a generalized single-slice approach: The case of self-assembled quantum dots
- Gontard, L.C.
- Pizarro, J.
- Ruiz-Zafra, Á.
- Hernández-Saz, J.
Zeitschrift:
Materials Characterization
ISSN: 1044-5803
Datum der Publikation: 2020
Ausgabe: 164
Art: Artikel