Reactivity enhancement and fingerprints of point defects on a MoS2 monolayer assessed by ab initio atomic force microscopy
- González, C.
- Dappe, Y.J.
- Biel, B.
ISSN: 1932-7455, 1932-7447
Année de publication: 2016
Volumen: 120
Número: 30
Pages: 17115-17126
Type: Article