Puesta a punto del microanálisis EDX con el Microscopio Electrónico de Transmisión Zeiss en 10C

  1. A. López Galindo 1
  2. E. Fernández Segura 2
  3. A. Sánchez Navas 1
  4. M.J. Martínez Guerrero 2
  5. M. Ortega Huertas 1
  1. 1 Instituto Andaluz de Ciencias de la Tierra
    info

    Instituto Andaluz de Ciencias de la Tierra

    Granada, España

    ROR https://ror.org/00v0g9w49

  2. 2 Universidad de Granada
    info

    Universidad de Granada

    Granada, España

    ROR https://ror.org/04njjy449

Zeitschrift:
Revista de la Sociedad Geológica de España

ISSN: 0214-2708

Datum der Publikation: 1989

Ausgabe: 2

Nummer: 1-2

Seiten: 153-159

Art: Artikel

Andere Publikationen in: Revista de la Sociedad Geológica de España

Zusammenfassung

The Transmission Electron Microscope may be used in the TEM mode for the qualitative and quantitative chemical analysis of particles as small as 1 u and, using the STEM mode, down to some tens of Å. This work affords a complete description of sample preparation, both powder and ion milling, and also the best instrument settings for carryjng out the microanalysis, using a Zeiss EM 10C microscope. The proportionality factors that should be taken into account in calculating the chemical composition of the mineral are given, together with the correct methods for quantifying the various chemical elements present.