Quantitative analysis of minerals by XRD with a textural attachment

  1. Manuel Rodríguez Gallego
  2. J.D. Martín Ramos
Revista:
Boletín de la Sociedad Española de Mineralogía

ISSN: 0210-6558

Any de publicació: 1989

Volum: 12

Número: 0

Pàgines: 119-121

Tipus: Article

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Altres publicacions en: Boletín de la Sociedad Española de Mineralogía

Resum

An automaticed XRD texture attachment have been used in order to eliminate the preferent orientation effect in the diffracted intensities and avoid errors dues to dishomogenities in the samples. Thanks to the higher area xrayed and the possibility of obtain a good value of the distribution of positions. The sample holder make a movement of integration.

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