Phase-Type distributionscomputational aspects andapplications in electronics

  1. Ruiz Castro, Juan Eloy 1
  2. Acal González, Christian J. 1
  3. Aguilera del Pino, Ana María 1
  1. 1 Universidad de Granada
    info

    Universidad de Granada

    Granada, España

    ROR https://ror.org/04njjy449

Revue:
BEIO, Boletín de Estadística e Investigación Operativa

ISSN: 1889-3805

Année de publication: 2021

Volumen: 37

Número: 1

Pages: 3-18

Type: Article

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D'autres publications dans: BEIO, Boletín de Estadística e Investigación Operativa

Résumé

Reliability is an area of statistics that analyzes the behaviour of sys-tems subject to failures where probability plays a fundamental role inmodeling, solving and optimization problems. It is usual to develop me-thodologies that allow a detailed study through classic distributions. Animportant aspect is the estimation of the parameters. A class of non-negative distributions, called phase-type distributions, makes it possibleto model complex problems with well-structured results, thanks to itsmatrix-algebraic form. The computational aspects of the estimation inthis field, through statistical programmes or applications such as R, Mat-lab or EMpht, are revised and applied to a real data set from RRAMmemories in order to prove that this approach is better than the classicstatistical analysis employed in this area.

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