Influence of the interface-state density on the electron mobility in silicon inversion layers
ISSN: 0361-5235, 1543-186X
Year of publication: 1993
Volume: 22
Issue: 9
Pages: 1159-1163
Type: Article
ISSN: 0361-5235, 1543-186X
Year of publication: 1993
Volume: 22
Issue: 9
Pages: 1159-1163
Type: Article