New material design of fast switching phase change memory as the benchmark for FD-SOI devices
- Kim, Y.T.
- Choi, M.
- Kwon, S.
- Jhon, Y.M.
- Gamiz, F.
Actes de conférence:
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2019
ISBN: 9781728116587
Année de publication: 2019
Type: Communication dans un congrès