Multisubband ensemble Monte Carlo analysis of tunneling leakage mechanisms in ultrascaled FDSOI, DGSOI, and FinFET devices

  1. Medina-Bailon, C.
  2. Padilla, J.L.
  3. Sadi, T.
  4. Sampedro, C.
  5. Godoy, A.
  6. Donetti, L.
  7. Georgiev, V.P.
  8. Gámiz, F.
  9. Asenov, A.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2019

Volume: 66

Issue: 3

Pages: 1145-1152

Type: Article

DOI: 10.1109/TED.2019.2890985 GOOGLE SCHOLAR
Data source: Scopus