Multisubband ensemble Monte Carlo analysis of tunneling leakage mechanisms in ultrascaled FDSOI, DGSOI, and FinFET devices
- Medina-Bailon, C.
- Padilla, J.L.
- Sadi, T.
- Sampedro, C.
- Godoy, A.
- Donetti, L.
- Georgiev, V.P.
- Gámiz, F.
- Asenov, A.
ISSN: 0018-9383
Year of publication: 2019
Volume: 66
Issue: 3
Pages: 1145-1152
Type: Article