Scaling FDSOI technology down to 7 nm - A physical modeling study based on 3D phase-space subband boltzmann transport
- Stanojević, Z.
- Baumgartner, O.
- Schanovsky, F.
- Strof, G.
- Kernstock, C.
- Karner, M.
- Medina, J.M.G.
- Ruiz, F.G.
- Godoy, A.
- Gámiz, F.
Actas:
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018
ISBN: 9781538648117
Año de publicación: 2018
Volumen: 2018-January
Páginas: 1-4
Tipo: Aportación congreso