On the influence of the back-gate bias on InGaAs Trigate MOSFETs
- Marin, E.G.
- Ruiz, F.G.
- Godoy, A.
- Gonzalez-Medina, J.M.
- Tienda-Luna, I.M.
- Toral, A.
- Gamiz, F.
Actas:
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2016
ISBN: 9781467386098
Ano de publicación: 2016
Páxinas: 230-233
Tipo: Achega congreso