Direct characterization of impact ionization current in silicon-on-insulator body-contacted MOSFETs
- Marquez, C.
- Rodriguez, N.
- Montes, J.M.
- Ruiz, R.
- Gamiz, F.
- Sampedro, C.
- Ohata, A.
ISSN: 1938-6737, 1938-5862
ISBN: 9781607685395
Year of publication: 2015
Volume: 66
Issue: 5
Pages: 93-99
Type: Conference paper