Determination of effective capacitance area for pseudo-MOSFET based characterization of bare soi wafers by split-C(V) measurements
- Fernandez, C.
- Rodriguez, N.
- Ohata, A.
- Diab, A.
- Gamiz, F.
- Cristoloveanu, S.
ISSN: 1938-5862, 1938-6737
ISBN: 9781607683780
Argitalpen urtea: 2013
Alea: 53
Zenbakia: 5
Orrialdeak: 209-217
Mota: Biltzar ekarpena