The effect of surface roughness scattering on hole mobility in double gate silicon-on-insulator devices

  1. Donetti, L.
  2. Gámiz, F.
  3. Rodriguez, N.
  4. Godoy, A.
  5. Sampedro, C.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2009

Volume: 106

Issue: 2

Type: Article

DOI: 10.1063/1.3176498 GOOGLE SCHOLAR
Data source: Scopus