Enhanced electron transport by carrier overshoot in ultrascaled double gate MOSFETs
- Rodriguez, N.
- Donetti, L.
- Sampedro, C.
- Martinez-Carricondo, F.
- Gamiz, F.
Proceedings:
ULIS 2008 - 9th International Conference on ULtimate Integration of Silicon
ISBN: 9781424417308
Year of publication: 2008
Pages: 203-206
Type: Conference paper