Compact modeling and contact effects in thin film transistors

  1. Tejada, J.A.J.
  2. Villanueva, J.A.L.
  3. Varo, P.L.
  4. Awawdeh, K.M.
  5. Deen, M.J.
Revue:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Année de publication: 2014

Volumen: 61

Número: 2

Pages: 266-277

Type: Article

DOI: 10.1109/TED.2013.2282994 GOOGLE SCHOLAR
La source de données: Scopus