Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: Challenges and opportunities

  1. Simoen, E.
  2. Aoulaiche, M.
  3. Dos Santos, S.D.
  4. Martino, J.A.
  5. Strobel, V.
  6. Cretu, B.
  7. Routoure, J.-M.
  8. Carin, R.
  9. Luque Rodríguez, A.
  10. Jiḿenez Tejada, J.A.
  11. Claeys, C.
Journal:
ECS Journal of Solid State Science and Technology

ISSN: 2162-8769 2162-8777

Year of publication: 2013

Volume: 2

Issue: 11

Type: Article

DOI: 10.1149/2.011311JSS GOOGLE SCHOLAR

Sustainable development goals