Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs
- Simoen, E.
- Aoulaiche, M.
- Dos Santos, S.D.
- Martino, J.A.
- Strobel, V.
- Cretu, B.
- Routoure, J.-M.
- Carin, R.
- Luque Rodríguez, A.
- Jiménez Tejada, J.A.
- Claeys, C.
ISSN: 1938-5862, 1938-6737
ISBN: 9781607683780
Year of publication: 2013
Volume: 53
Issue: 5
Pages: 49-61
Type: Conference paper