High doping density/high electric field, stress and heterojunction effects on the characteristics of CMOS compatible p-n junctions
- Simoen, E.
- Eneman, G.
- Gonzalez, M.B.
- Kobayashi, D.
- Rodrguez, A.L.
- Jiménez Tejada, J.-A.
- Claeys, C.
Zeitschrift:
Journal of the Electrochemical Society
ISSN: 0013-4651
Datum der Publikation: 2011
Ausgabe: 158
Nummer: 5
Art: Rezension