Modeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions
- Rodríguez, A.L.
- Tejada, J.A.J.
- Rodríguez-Bolivar, S.
- González, M.B.
- Eneman, G.
- Claeys, C.
- Simoen, E.
Proceedings:
2010 Proceedings of the European Solid State Device Research Conference, ESSDERC 2010
ISBN: 9781424466610
Year of publication: 2010
Pages: 384-387
Type: Conference paper