Characterization of impurities in GaInNAs pn junctions from capacitance transient spectroscopy

  1. Jiménez Tejada, J.A.
  2. Deen, M.J.
  3. Lara Bullejos, P.
  4. López Villanueva, J.A.
  5. Gómez-Campos, F.M.
  6. Rodríguez-Bolívar, S.
Actes de conférence:
2007 Spanish Conference on Electron Devices, Proceedings

ISBN: 9781424408689

Année de publication: 2007

Pages: 139-142

Type: Communication dans un congrès

DOI: 10.1109/SCED.2007.384012 GOOGLE SCHOLAR
La source de données: Scopus