Analysis of the Characteristic Current Fluctuations in the High Resistance State of HfO2-based Memristors

  1. Gonzalez, M.B.
  2. Zabala, M.
  3. Kalam, K.
  4. Tamm, A.
  5. Jimenez-Molinos, F.
  6. Roldan, J.B.
  7. Campabadal, F.
Actas:
Proceedings of the 2021 13th Spanish Conference on Electron Devices, CDE 2021

ISBN: 9781665444521

Ano de publicación: 2021

Páxinas: 8-11

Tipo: Achega congreso

DOI: 10.1109/CDE52135.2021.9455725 GOOGLE SCHOLAR
Fonte de datos: Scopus