Time series modeling of the cycle-to-cycle variability in h-BN based memristors

  1. Roldan, J.B.
  2. Maldonado, D.
  3. Alonso, F.J.
  4. Roldan, A.M.
  5. Hui, F.
  6. Shi, Y.
  7. Jimenez-Molinos, F.
  8. Aguilera, A.M.
  9. Lanza, M.
Aktak:
IEEE International Reliability Physics Symposium Proceedings

ISSN: 1541-7026

ISBN: 9781728168937

Argitalpen urtea: 2021

Alea: 2021-March

Mota: Biltzar ekarpena

DOI: 10.1109/IRPS46558.2021.9405100 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus