Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

1. Roldan, J.B.
2. Maldonado, D.
3. Jimenez-Molinos, F.
4. Acal, C.
5. Ruiz-Castro, J.E.
6. Aguilera, A.M.
7. Hui, F.
8. Kong, J.
9. Shi, Y.
10. Jing, X.
11. Wen, C.
12. Villena, M.A.
13. Lanza, M.