Recommended Methods to Study Resistive Switching Devices
- Lanza, M.
- Wong, H.S.P.
- Pop, E.
- Ielmini, D.
- Strukov, D.
- Regan, B.C.
- Larcher, L.
- Villena, M.A.
- Yang, J.J.
- Goux, L.
- Belmonte, A.
- Yang, Y.
- Puglisi, F.M.
- Kang, J.
- Magyari-Köpe, B.
- Yalon, E.
- Kenyon, A.
- Buckwell, M.
- Mehonic, A.
- Shluger, A.
- Li, H.
- Hou, T.-H.
- Hudec, B.
- Akinwande, D.
- Ge, R.
- Ambrogio, S.
- Roldan, J.B.
- Miranda, E.
- Suñe, J.
- Pey, K.L.
- Wu, X.
- Raghavan, N.
- Wu, E.
- Lu, W.D.
- Navarro, G.
- Zhang, W.
- Wu, H.
- Li, R.
- Holleitner, A.
- Wurstbauer, U.
- Lemme, M.C.
- Liu, M.
- Long, S.
- Liu, Q.
- Lv, H.
- Padovani, A.
- Pavan, P.
- Valov, I.
- Jing, X.
- Han, T.
- Zhu, K.
- Chen, S.
- Hui, F.
- Shi, Y.
- Show all authors +
Journal:
Advanced Electronic Materials
ISSN: 2199-160X
Year of publication: 2019
Volume: 5
Issue: 1
Type: Review