Phase-type distributions for studying variability in resistive memories

  1. Acal, C.
  2. Ruiz-Castro, J.E.
  3. Aguilera, A.M.
  4. Jiménez-Molinos, F.
  5. Roldán, J.B.
Journal:
Journal of Computational and Applied Mathematics

ISSN: 0377-0427

Year of publication: 2019

Volume: 345

Pages: 23-32

Type: Article

DOI: 10.1016/J.CAM.2018.06.010 GOOGLE SCHOLAR
Data source: Scopus