A Kinetic Monte Carlo Simulator to Characterize Resistive Switching and Charge Conduction in Ni/HfO 2 /Si RRAMs

  1. Aldana, S.
  2. García-Fernández, P.
  3. Romero-Zaliz, R.
  4. González, M.B.
  5. Jiménez-Molinos, F.
  6. Campabadal, F.
  7. Gómez-Campos, F.
  8. Roldán, J.B.
Konferenzberichte:
Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

ISBN: 9781538657799

Datum der Publikation: 2018

Art: Konferenz-Beitrag

DOI: 10.1109/CDE.2018.8597010 GOOGLE SCHOLAR
Datenquelle: Scopus