Analysis of conductive filament density in resistive random access memories: A 3D kinetic Monte Carlo approach

  1. Aldana, S.
  2. García-Fernández, P.
  3. Romero-Zaliz, R.
  4. Jiménez-Molinos, F.
  5. Gómez-Campos, F.
  6. Roldán, J.B.
Revue:
Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics

ISSN: 2166-2754,  2166-2746

Année de publication: 2018

Volumen: 36

Número: 6

Type: Article

DOI: 10.1116/1.5049213 GOOGLE SCHOLAR
La source de données: Scopus