Multivariate analysis and extraction of parameters in resistive RAMs using the Quantum Point Contact model
- Roldán, J.B.
- Miranda, E.
- González-Cordero, G.
- García-Fernández, P.
- Romero-Zaliz, R.
- González-Rodelas, P.
- Aguilera, A.M.
- González, M.B.
- Jiménez-Molinos, F.
ISSN: 1089-7550, 0021-8979
Year of publication: 2018
Volume: 123
Issue: 1
Type: Article