In-depth study of the physics behind resistive switching in TiN/Ti/HfO2/W structures

  1. González-Cordero, G.
  2. Jiménez-Molinos, F.
  3. Roldán, J.B.
  4. González, M.B.
  5. Campabadal, F.
Zeitschrift:
Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics

ISSN: 2166-2754,  2166-2746

Datum der Publikation: 2017

Ausgabe: 35

Nummer: 1

Art: Artikel

DOI: 10.1116/1.4973372 GOOGLE SCHOLAR
Datenquelle: Scopus