A Machine Learning Algorithm for Reliability Analysis

  1. Gamiz, M.L.
  2. Navas-Gomez, F.J.
  3. Raya-Miranda, R.
Revue:
IEEE Transactions on Reliability

ISSN: 1558-1721,  0018-9529

Année de publication: 2021

Volumen: 70

Número: 2

Pages: 535-546

Type: Article

DOI: 10.1109/TR.2020.3011653 GOOGLE SCHOLAR
La source de données: Scopus