Compact Modeling of Multi-Layered MoS2FETs including Negative Capacitance Effect
- Nandan, K.
- Yadav, C.
- Rastogi, P.
- Toral-Lopez, A.
- Marin-Sanchez, A.
- Marin, E.G.
- Ruiz, F.G.
- Bhowmick, S.
- Chauhan, Y.S.
Journal:
IEEE Journal of the Electron Devices Society
ISSN: 2168-6734
Year of publication: 2020
Volume: 8
Pages: 1177-1183
Type: Article