Analyzing a firm's international portfolio of technological knowledge: A declarative ontology-based OWL approach for patent documents

  1. Bermudez-Edo, M.
  2. Noguera, M.
  3. Hurtado-Torres, N.
  4. Hurtado, M.V.
  5. Garrido, J.L.
Aldizkaria:
Advanced Engineering Informatics

ISSN: 1474-0346

Argitalpen urtea: 2013

Alea: 27

Zenbakia: 3

Orrialdeak: 358-365

Mota: Artikulua

DOI: 10.1016/J.AEI.2013.02.003 GOOGLE SCHOLAR
Datuen iturria: Scopus