Thin layers characterization by low frequency ultrasonic transmission
- Mittal, R.
- Rus, G.
Actas:
Emerging Technologies in ETNDT - Proceedings of the 4th International Conference on Emerging Technologies in Non-Destructive Testing, ETNDT 4
ISBN: 9780415464765
Año de publicación: 2008
Páginas: 113-119
Tipo: Aportación congreso