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Dynamic range measurement and calibration of SiPMs
Bretz, T.
Hebbeker, T.
Lauscher, M.
Middendorf, L.
Niggemann, T.
Schumacher, J.
Stephan, M.
Bueno, A.
Navas, S.
Ruiz, A.G.
Journal
:
Journal of Instrumentation
ISSN
:
1748-0221
Year of publication
:
2016
Volume
:
11
Issue
:
3
Type
:
Article
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DOI:
10.1088/1748-0221/11/03/P03009
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