Reliability insights into low frequency noise in high-mobility transistors

1. Simoen, E.
2. Romeo, T.
3. Pantisano, L.
4. Luque Rodrjguez, A.
5. Jimenez Tejada, J.A.
6. Aoulaiche, M.
7. Veloso, A.
8. Jurczak, M.
9. Krom, R.
10. Mitard, J.
11. Caillat, Ch.
12. Fazan, P.
13. Crupi, F.
14. Claeys, C.