Statistical Characterization of the Multicluster Two-Wave Fading Model
- Olyaee, M.
- Pena-Martin, J.P.
- Lopez-Martinez, F.J.
- Romero-Jerez, J.M.
Actas:
Proceedings - 2022 5th International Conference on Advanced Communication Technologies and Networking, CommNet 2022
ISBN: 9781665450546
Año de publicación: 2022
Tipo: Aportación congreso