Analysis of the edge region photocapacitance at constant bias in Te-doped Al0.55Ga0.45As

  1. Morante, J.R.
  2. Samitier, J.
  3. Herms, A.
  4. Cornet, A.
  5. Cartujo, P.
Journal:
Solid State Electronics

ISSN: 0038-1101

Year of publication: 1986

Volume: 29

Issue: 7

Pages: 759-766

Type: Article

DOI: 10.1016/0038-1101(86)90163-2 GOOGLE SCHOLAR
Data source: Scopus