Assessment of Gate Leakage Mechanism utilizing Multi-Subband Ensemble Monte Carlo
- Medina-Bailon, C.
- Sadi, T.
- Sampedro, C.
- Padilla, J. L.
- Godoy, A.
- Donetti, L.
- Georgiev, V.
- Gamiz, F.
- Asenov, A.
- Sarafis, P (coord.)
- Nassiopoulou, AG (coord.)
ISSN: 2330-5738
ISBN: 978-1-5090-5313-1
Datum der Publikation: 2017
Seiten: 144-147
Kongress: Joint International Workshop / International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Art: Konferenz-Beitrag