Gate voltage and temperature dependencies of up and down times of RTS in MOS structures: A theoretical study

  1. Palma, A
  2. Godoy, A
  3. Jimenez-Tejada, JA
  4. Carceller, JE
Libro:
NOISE IN PHYSICAL SYSTEMS AND 1/F FLUCTUATIONS, PROCEEDINGS OF THE 14TH INTERNATIONAL CONFERENCE
  1. Claeys, C (coord.)
  2. Simoen, E (coord.)

ISBN: 981-02-3141-5

Año de publicación: 1997

Páginas: 210-213

Congreso: 14th International Conference on Noise in Physical Systems and l/f Fluctuations (ICNF 97)

Tipo: Aportación congreso

GOOGLE SCHOLAR
Fuente de los datos: WoS