Enhanced capabilities of the nano-electronic simulation software (NESS)

  1. Medina-Bailon, C.
  2. Badami, O.
  3. Carrillo-Nunez, H.
  4. Dutta, T.
  5. Nagy, D.
  6. Adamu-Lema, F.
  7. Georgiev, V.P.
  8. Asenov, A.
Actas:
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

ISBN: 9784863487635

Ano de publicación: 2020

Volume: 2020-September

Páxinas: 293-296

Tipo: Achega congreso

DOI: 10.23919/SISPAD49475.2020.9241594 GOOGLE SCHOLAR

Obxectivos de Desenvolvemento Sustentable

Fonte de datos: Scopus