Full-wave modeling of broadband near field scanning microwave microscopy

  1. Wu, B.-Y.
  2. Sheng, X.-Q.
  3. Fabregas, R.
  4. Hao, Y.
Aldizkaria:
Scientific Reports

ISSN: 2045-2322

Argitalpen urtea: 2017

Alea: 7

Zenbakia: 1

Mota: Artikulua

DOI: 10.1038/S41598-017-13937-5 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus