Using TCAD Simulations to Verify the McWhorter Method for Assessing Trapped Charge in Dielectric

  1. Veljkovic, S.
  2. Ristic, G.
  3. Dankovic, D.
  4. Palma, A.J.
  5. Andjelkovic, M.
  6. Duane, R.
Actas:
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023

ISBN: 9798350347760

Año de publicación: 2023

2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023

Tipo: Aportación congreso

DOI: 10.1109/MIEL58498.2023.10315943 GOOGLE SCHOLAR
Fuente de los datos: Scopus