Temperature Effects on the Sensitivity of Gamma MOSFET Dosimeters
- Ruiz-Garcia, I.
- Martin-Holgado, P.
- Escobedo, P.
- Morilla, Y.
- Palma, A.J.
- Carvajal, M.A.
Konferenzberichte:
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
ISBN: 9798350347760
Datum der Publikation: 2023
2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
Art: Konferenz-Beitrag