Back-gate effects and detailed characterization of junctionless transistor
- Parihar, Mukta Singh
- Liu, Fan Yu
- Navarro, Carlos
- Barraud, Sylvain
- Bawedin, Maryline
- Ionica, Irina
- Kranti, Abhinav
- Cristoloveanu, Sorin
- Pribyl, W (coord.)
- Grasser, T (coord.)
- Schrems, M (coord.)
ISSN: 1930-8876
ISBN: 978-1-4673-7135-3
Ano de publicación: 2015
Páxinas: 282-285
Congreso: 45th European Solid-State Device Research Conference (ESSDERC)
Tipo: Achega congreso