Publications (1,025) Publications in which a researcher has participated

2024

  1. A coupled electrothermal lithium-ion battery reduced-order model including heat generation due to solid diffusion

    Applied Energy, Vol. 367

  2. Advanced Detection of Failed LEDs in a Short Circuit for Automotive Lighting Applications

    Sensors, Vol. 24, Núm. 9

  3. Assessment of the Performance of a Commercial Spectral Sensor for Portable and Cost-Effective Multispectral Applications

    Proceedings - 2024 27th Euromicro Conference on Digital System Design, DSD 2024

  4. Bed-Based Ballistocardiography System Using Flexible RFID Sensors for Noninvasive Single- and Dual-Subject Vital Signs Monitoring

    IEEE Transactions on Instrumentation and Measurement, Vol. 73, pp. 1-12

  5. Caracterización física de fotorresistencias como dosímetros en radioterapia

    Revista de Física Médica, Vol. 25, Núm. 1, pp. 61-64

  6. Compact modeling of hysteresis in organic thin-film transistors

    Organic Electronics, Vol. 129

  7. Development, characterization and validation of a novel physics-informed equivalent circuit model for silicon–graphite battery cells

    Journal of Energy Storage, Vol. 100

  8. Evaluation of Plantar Pressure Sensors for Classification of Ski Gear Using Deep Learning Models

    Lecture Notes in Networks and Systems

  9. Gear Classification in Skating Cross-Country Skiing Using Inertial Sensors and Deep Learning

    Sensors, Vol. 24, Núm. 19

  10. LED biasing scheme with thermal compensation for automotive industry applications

    Results in Engineering, Vol. 21

  11. Modeling current-rate effects in lithium-ion batteries based on a distributed, multi-particle equivalent circuit model

    Applied Energy, Vol. 353

  12. POC device for rapid oral pH determination based on a smartphone platform

    Microchimica Acta, Vol. 191, Núm. 3

  13. Smartphone-based and non-invasive sleep stage identification system with piezo-capacitive sensors

    Sensors and Actuators A: Physical, Vol. 376

  14. Thermal Annealing-Induced Recovery of the <FOR VERIFICATION> V T of Irradiated Commercial MOS Transistors

    Journal of Circuits, Systems and Computers