GRUPO DE INVESTIGACIÓN EN NANOELECTRÓNICA
NRG
University of Paris-Saclay
Gif-sur-Yvette, FranciaPublicaciones en colaboración con investigadores/as de University of Paris-Saclay (2)
2016
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Theoretical characterisation of point defects on a MoS2 monolayer by scanning tunnelling microscopy
Nanotechnology, Vol. 27, Núm. 10
2010
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Comparison of semiclassical transport formulations including quantum corrections for advanced devices with high-κ gate stacks
2010 14th International Workshop on Computational Electronics, IWCE 2010